· High-Throughput Parallel TestingSupports 2- to 4-site parallel testing with per-pin SMU architecture
Boosts WPH and yield while reducing test cost and cleanroom footprint
· Scalable & Flexible DesignSupports external instruments for diverse test applications
Powerful Testing Capability. Up to 48 pins with full Kelvin connections
· Ultra-High Precision1 pA measurement accuracy
System leakage below 100 fA
· Comprehensive CompatibilityCompatible with mainstream 48-pin probe cards and probers like TEL and TSK series
· Integrated Smart SoftwareCAL, DIAG, and PV software enable customizable logs, fast diagnostics, and remote monitoring
